Mitigating challenges in aberration-corrected electron-beam lithography on electron-opaque substrates.

Aberration-corrected electron-beam lithography (AC-EBL) using ultra-thin electron transparent membranes has achieved single-digit nanometer resolution in two widely used electron-beam resists: poly (methyl methacrylate) (PMMA) and hydrogen silsesquioxane (HSQ). On the other hand, AC-EBL implementation on thick, electron-opaque substrates is appealing for conventional top-down fabrication of quantum devices with nanometer-scale features. To investigate the performance of AC-EBL on thick substrates, we measured the lithographic point spread function (L-PSF) of a 200 keV aberration-corrected scanning transmission electron microscope (AC-STEM) by defining both positive and negative patterns in PMMA thin films, spin-cast on thick SiO2 /Si substrates. We present the problems encountered during pre-exposure beam focusing and discuss methods to overcome them. In addition, applying some of these methods using commercial 50-nm-thick SiNX membranes with thick Si support frames, we printed arrays of holes in PMMA with pitches around 26 nm on SiNX /Si substrates with increasing Si thickness. Our results show that proximity effects from even 50-nm-thick SiNX membranes limit hole arrays to 20 nm pitch; however, down to this limit, the effect of the substrate thickness on the pattern quality is minimal. These results highlight the need for novel resists less susceptible to proximity effects, or resists which can be used directly, after development, as the dielectric material in periodic gates in 2D quantum devices.