'Wrong bonds' in sputtered amorphous Ge(2)Sb(2)Te(5)

P Jóvári, I Kaban, J Steiner, B Beuneu, A Schöps, A Webb
Journal of Physics. Condensed Matter: An Institute of Physics Journal 2007 August 22, 19 (33): 335212
The structure of sputtered amorphous Ge(2)Sb(2)Te(5) was investigated by high energy x-ray diffraction, neutron diffraction and Ge-, Sb- and Te K-edge EXAFS measurements. The five datasets were modelled simultaneously in the framework of the reverse Monte Carlo simulation technique. It was found that apart from Te-Sb and Te-Ge bonds existing in the crystalline phases, Ge-Ge and Sb-Ge bonding is also significant in sputtered amorphous Ge(2)Sb(2)Te(5). According to our results, all components obey the '8-N' rule.

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