Spectral domain optical coherence tomography imaging with an integrated optics spectrometer

V Duc Nguyen, B Imran Akca, Kerstin Wörhoff, René M de Ridder, Markus Pollnau, Ton G van Leeuwen, Jeroen Kalkman
Optics Letters 2011 April 1, 36 (7): 1293-5
We designed and fabricated an arrayed-waveguide grating (AWG) in silicon oxynitride as a spectrometer for spectral domain optical coherence tomography (SD-OCT). The AWG has a footprint of only 3.0 cm × 2.5 cm, operates at a center wavelength of 1300 nm, and has 78 nm free spectral range. OCT measurements are performed that demonstrate imaging up to a maximum depth of 1 mm with an axial resolution of 19 μm, both in agreement with the AWG design parameters. Using the AWG spectrometer combined with a fiber-based SD-OCT system, we demonstrate cross-sectional OCT imaging of a multilayered scattering phantom.


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