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Journal Article
Research Support, Non-U.S. Gov't
Extended focus depth for Fourier domain optical coherence microscopy.
Optics Letters 2006 August 16
We report on a new detection scheme for Fourier domain optical coherence microscopy that exhibits high transverse resolution along an axially extended focal range. Nearly constant transverse resolution of approximately 1.5 microm along a focal range of 200 microm is experimentally verified with a maximum sensitivity of 105 dB. A broad-bandwidth Ti:sapphire laser allowed for an axial resolution of 3 microm in air.
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