Haizhong Guo, Ruiqiang Zhao, Kui-Juan Jin, Lin Gu, Dongdong Xiao, Zhenzhong Yang, Xiaolong Li, Le Wang, Xu He, Junxing Gu, Qian Wan, Can Wang, Huibin Lu, Chen Ge, Meng He, Guozhen Yang
Varying the film thickness is a precise route to tune the interfacial strain to manipulate the properties of the multiferroic materials. Here, to explore the effects of the interfacial strain on the properties of the multiferroic BiFeO3 films, we investigated thickness-dependent structural and polarization evolutions of the BiFeO3 films. The epitaxial growth with an atomic stacking sequence of BiO/TiO2 at the interface was confirmed by scanning transmission electron microscopy. Combining X-ray diffraction experiments and first-principles calculations, a thickness-dependent structural evolution was observed from a fully strained tetragonality to a partially relaxed one without any structural phase transition or rotated twins...
February 4, 2015: ACS Applied Materials & Interfaces