Yi-Sheng Liu, Sohee Jeong, James White, Xuefei Feng, Eun Seon Cho, Vitalie Stavila, Mark Allendorf, Jeffrey Urban, Jinghua Guo
In this article, the capabilities of soft and hard X-ray techniques, including X-ray absorption (XAS), soft X-ray emission spectroscopy (XES), resonant inelastic soft X-ray scattering (RIXS), X-ray photoelectron spectroscopy (XPS), and X-ray diffraction (XRD), and their application to solid-state hydrogen storage materials are presented. These characterization tools are indispensable for interrogating hydrogen storage materials at the relevant length scales of fundamental interest, which range from the micron scale to nanometer dimensions...
February 8, 2019: Chemphyschem: a European Journal of Chemical Physics and Physical Chemistry